Physical properties of Cu2ZnSnS4 thin films deposited by spray pyrolysis technique

Abstract

Thin films of Cu2ZnSnS4 (CZTS) were deposited on Pyrex substrates at various temperatures by spray pyrolysis technique from aqueous solution containing an economic stannous chloride (SnCl2) precursor for the tin and the effect of substrate temperature on the structural and opto-electronic properties was investigated. X-ray diffraction patterns and Raman spectroscopy reveal that all the CZTS films exhibited kesterite structure with preferential orientation along the (1 1 2) direction and some secondary phases. Also, they possessed different band gaps, which were found to lie between 1.52 and 1.81 eV, indicating that CZTS compound has absorbing properties favorable for applications in solar cell devices. Van der Pauw technique and Hall effect measurements were used to determine the electrical properties of CZTS films and the resistivity was of about 0.12 cm for film grown at 280 °C. © 2013 American Institute of Physics.