3-in-1 X-ray Computed Tomography

Abstract

For over 30 years, X-ray Computed Tomography (CT) has been used for Non-Destructive Testing (NDT) of manufactured components for validation of internal integrity [1]. More recently the first X-ray CT systems dedicated to dimensional metrology applications have reached the market. Since then, the field of dimensional X-ray CT has gained much interest, especially for inspection of Additively Manufactured (AM) components [2]. This novel manufacturing route has brought new challenges for inspection due to internal or inaccessible features and unique surface characteristics. Recent research has demonstrated the feasibility for surface metrology with commercially available micro-CT systems [3] [4]. The potential for performing dimensional, integrity and surface analysis within a single process has made X-ray CT highly desirable for AM inspection. Further innovation is required however, in order to produce a commercial hardware and software that can complete the complex workflow required for 3-in-1 inspection.