A 16-Gb/s -11.6-dBm OMA Sensitivity 0.7-pJ/bit Optical Receiver in 65-nm CMOS Enabled by Duobinary Sampling

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Abstract

High-speed, low-power optical interconnects, such as intensity modulation direct detection (IMDD) optical links, are increasingly deployed in data centers to keep pace with the growing bandwidth requirements. High-sensitivity low-power optical receivers (RXs) are the key components that enable energy-efficient IMDD optical interconnects. This article presents a low-power nonreturn-to-zero (NRZ) optical RX using a combination of a limited-bandwidth trans-impedance amplifier (TIA) and duobinary sampling to improve RX sensitivity at high data rates. Duobinary sampling leverages the well-controlled TIA inter-symbol interference (ISI) to recover the transmitted data, making it much more hardware efficient than canceling the ISI using a decision feedback equalizer (DFE). The proposed optical RX employs a CMOS-based analog front-end (AFE) to achieve high linearity and excellent power efficiency. Fabricated in 65-nm CMOS process, the prototype RX achieves optical modulation amplitude (OMA) sensitivity of -11.6 dBm at 16 Gb/s with 0.7-pJ/bit efficiency.

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APA

Ahmed, M. G., Kim, D., Nandwana, R. K., Elkholy, A., Lakshmikumar, K. R., & Hanumolu, P. K. (2021). A 16-Gb/s -11.6-dBm OMA Sensitivity 0.7-pJ/bit Optical Receiver in 65-nm CMOS Enabled by Duobinary Sampling. IEEE Journal of Solid-State Circuits, 56(9), 2795–2803. https://doi.org/10.1109/JSSC.2021.3064248

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