Methodology for determination of the number of equipment malfunctions due to voltage sags

Abstract

This article deals with the assessment of the reliability of sensitive equipment due to voltage sags. The most frequent problems of power quality are voltage sags. Equipment that cannot withstand short-term voltage sag is defined as sensitive device. Sensitivity of such equipment can be described by the voltage-tolerance curves. A device (generator) to generate voltage sags (also interruptions) with duration at least 1 ms has been designed and developed for this purpose. Equipment sensitive to voltage sags was tested using this generator. Overall, five types of sensitive equipment were tested: personal computers, fluorescent lamps, drives with speed control, programmable logic controllers, and contactors. The measured sensitivity curves of these devices have been used to determine the number of trips (failures) due to voltage sags. Two probabilistic methods (general probability method and cumulative probability method) to determine probability of equipment failure occurrence are used. These methods were applied to real node in the distribution system with its actual performance of voltage sags/swells. The calculations also contain different levels of sensitivity of the sensitive equipment.