Kelvin probe force gradient microscopy of WSe2 monolayers on Ni

Abstract

This work presents the results of an investigation of WSe2 thin layers on the Ni film by Scanning Probe Microscopy (SPM) methods. To determine surface potential, Kelvin probe force gradient microscopy (KPFGM) was used. Dependences of the surface potential and work function on the number of monolayers of the structure are presented. The band structure and type of doping of the WSe2 monolayer on the Ni film were determined. These data can be important for measuring the number of WSe2 layers by KPFGM and for designing nanodevices because the work function and the surface potential have a strong influence on the operation of such devices.