Dynamic Reliability Assessment Method for a Pantograph System Based on a Multistate T-S Fault Tree, Dynamic Bayesian

12Citations
Citations of this article
8Readers
Mendeley users who have this article in their library.

Abstract

The operational reliability of rail vehicle pantograph systems is evaluated by transforming T-S multistate fault trees into dynamic Bayesian networks (DBNs), which take into account system multistability, long-lasting operation, dynamic failure, and maintenance recovery. The T-S multistate fault tree structure is constructed by the content validity ratio and content validity index; the T-S gate rule expressing causal uncertainty is constructed by using fuzzy theory and dependent uncertain ordered weighted averaging expert scoring, and finally, the pantograph T-S multistate fault tree is transformed into a DBN model characterizing the dynamic interaction and time dependence of the system. The dynamic evolution laws of reliability of a pantograph system in maintenance and maintenance-free states over time are inferred, compared and analyzed. The results show that the system availability of a pantograph system decreases continuously during 720 days of operation. The system availability without maintenance decreases to 0.881, and the system availability with maintenance is 0.952. The reliability of a pantograph system can be effectively ensured with maintenance during the operation period; the sensitivity analysis is performed by changing the failure rate of the equipment to 120% or 80%; the fall indicator, the electrical control box, and the elevating bow motor are the weak links in the system, and the impact of fault escalation on the reliability of a pantograph system is analyzed. It is then verified that the system reliability can be further improved by using a preventive maintenance strategy, and the steady-state reliability can be gradually reached, which is about 0.9968, providing a reference for the maintenance of a pantograph system.

Cite

CITATION STYLE

APA

Chen, Y., Wen, J., Tian, Y., Zheng, S., Zhong, Q., & Chai, X. (2023). Dynamic Reliability Assessment Method for a Pantograph System Based on a Multistate T-S Fault Tree, Dynamic Bayesian. Applied Sciences (Switzerland), 13(19). https://doi.org/10.3390/app131910711

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free