Diffraction peaks from correlated dislocations

Abstract

We show that the X-ray diffraction peaks from crystals with dislocations can be adequately modeled by pairs of dislocations of opposite sign with random position, orientation, and distance between dislocations in the pair. The mean distance between dislocations in the pair can be taken to be comparable to the mean distance between all dislocations, which corresponds to the Wilkens parameter M & 1 typical for many experiments. The diffraction peak profiles are calculated by the Monte Carlo method and compared with an analytical approximation.