Optical 3D measurement of scattering and specular reflecting surfaces

Abstract

This paper gives an introduction to the geometrical measurement of objects with scattering and specular reflecting surfaces using optical pattern projection techniques. While the measurement of scattering surfaces using structured illumination has found wide-spread application in research and industry, the raster reflection technique for specular reflecting surfaces is a new development. In both cases, predefined patterns are projected on the surface to be measured. Electronic cameras record the resulting images, which are evaluated using photogrammetric methods. The paper describes basic measurement setups, and outlines the evaluation of the measurements, together with the underlying models. Measurement examples illustrate the capabilities of both techniques. © 2008 IOP Publishing Ltd.