Abstract
Nondestructive imaging with both a large field of view and a high spatial resolution is crucial to understand complex materials and processes in science and technology. X-ray ptychography can provide highest spatial resolution but is limited in the field of view by the acquisition time and coherent flux at modern x-ray sources. By multi-beam ptychography, the sample can be imaged in parallel by several spatially separated and mutually incoherent beams. We have implemented this method using 3D nanoprinted x-ray optics to create tailor-made x-ray multi-beam arrays. The use of 3D printing allows us to create focusing optics with a minimum of nonfunctional support structures. In this way, large sample areas can be efficiently scanned in parallel with up to six illuminating beams.
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CITATION STYLE
Wittwer, F., Lyubomirskiy, M., Koch, F., Kahnt, M., Seyrich, M., Garrevoet, J., … Schroer, C. G. (2021). Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view. Applied Physics Letters, 118(17). https://doi.org/10.1063/5.0045571
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