Journal Article

Defect and error tolerance in the presence of massive numbers of defects

IEEE Design and Test of Computers (2004) 21(3) 216-227
DOI: 10.1109/MDT.2004.8
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Breuer, M. A., Gupta, S. K., & Mak, T. M. (2004). Defect and error tolerance in the presence of massive numbers of defects. IEEE Design and Test of Computers, 21(3), 216–227. https://doi.org/10.1109/MDT.2004.8

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