X-ray peak profile analysis of silica by Williamson–Hall and size-strain plot methods

Abstract

Annealed silica has been prepared by various annealing temperatures at 800 °C and 1000 °C. The crystallite size and lattice strain of silica were estimated by x-ray diffraction spectra analysis using various calculation methods; Modified Scherrer, Williamson-Hall (W-H), and Size-Strain Plot. Qualitative analysis confirms that the XRD patterns were hexagonal quartz. Annealing temperature cause a change in crystal size and lattice strain and all methods showed a decrease in the value of the crystal size with increasing annealing temperature from 800 °C to 1000 °C.