Imaging the domain structure of organic semiconductor films

Abstract

State-of-the-art solution-processed organic field-effect transistors typically use polycrystalline organic semiconductor thin films as the active layer. Although it is widely regarded that boundaries between polycrystalline domains are a likely source of charge trapping limiting charge carrier mobility, little is known about the detailed domain structure of such films. Furthermore, variations in local order particularly in conjugated polymer films are likely to further impede charge transport. In recent years a number of techniques have been exploited that are able to provide information regarding local domain orientation and molecular order in polycrystalline organic thin films. These techniques have provided new information regarding the nature of domain structure providing an opportunity to directly evaluate the influence of domain structure on device operation. This article aims to provide a timely review of the experimental approaches used to date and provide a perspective for future work. © 2011 Wiley Periodicals, Inc.