Coulomb blockade effects in stm-type tunnel junctions

Abstract

Experiments on single electron tunneling effects induced by the Coulomb blockade in small capacitance tunnel junctions are described. The tunnel junctions are of the point contact type, produced by means of scanning tunneling microscope techniques. Both single junctions and double junctions have been studied. The observed behaviour is compared with calculations based on Monte Carlo simulations. © 1992 IOP Publishing Ltd.