Abstract
This paper presents a high dynamic range (DR) linear-logarithmic (Lin-Log) CMOS image sensor (CIS) pixel with on-chip tunable linear range and threshold voltage cancellation scheme for reducing fix pattern noise (FPN). A column shared-OP with programmable gain was also applied to reduce the gain loss of source follower in conventional APS structure. A prototype chip with 100 × 100 pixel array and pixel pitch as 6 × 6 um2 and 3.3V operation has been designed and fabricated in 0.18um TSMC 1P6M standard process. The measured results achieve a dynamic range of 143dB, a FPN related to sensitivity in log response (rms/log-sensitivity) of 1.96%, and a FPN related to full-swing in log response (rms/Vlog-swing) of 0.45%, respectively. © 2012 IEEE.
Cite
CITATION STYLE
Chou, W. F., Yeh, S. F., & Hsieh, C. C. (2012). A 143dB 1.96% FPN linear-logarithmic CMOS image sensor with threshold-voltage cancellation and tunable linear range. In Proceedings of IEEE Sensors. https://doi.org/10.1109/ICSENS.2012.6411258
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