Phonon spectroscopy at high pressure by inelastic X-ray scattering

Abstract

The current status of phonon-dispersion studies at high pressure using very high energy resolution inelastic X-ray scattering is discussed. A brief description of the instrumental apparatus is given, together with an illustration of the high-pressure facilities available at the IXS beamlines ID16 and ID28 of the ESRF. Some selected examples of recent studies on crystalline and liquid samples in a diamond anvil cell are then presented. © 2009 International Union of Crystallography.