Study on surface morphology of nanoscale structure of pure and zinc-doped tin oxide uniform thin films

Abstract

In this study, we investigated the surface morphology of uniform pure and zinc-doped tin oxide thin films in detail. Films of undoped and Zn-doped tin oxide (SnO2: Zn) were prepared on glass substrates at 450° C by spray pyrolysis technique. Tin chloride dehydrate (SnCl2.2H 2O), and zinc acetate (Zn(CH3COO)2.2H 2O) and zinc chloride (ZnCl2) were used as sources of tin (Sn) and zinc (Zn), respectively. The variation in the solution concentration of the films was reflected in their morphologies as examined by scanning electron microscopy (SEM) and atomic force microscopy (AFM). Their findings show that the films have nanoscale structure. The surface parameters were calculated for thin films. The root mean square (RMS) roughness obtained for undoped SnO 2 thin films reduced with the addition of Zn in the starting solution. A comparison between the doped films with zinc acetate and zinc chloride shows a difference in their roughness. The electrical and optical properties of the films were also measured. Copyright © 2010 John Wiley & Sons, Ltd.