Aberration effects in quick X-Ray reflectivity of curved samples

Abstract

Quick x-ray reflectivity (QXRR) is a new surface examination technique for studying fast processes at the surface and interface of the materials on a nano-scale. The currently available models for classical scanning-type x-ray reflectivity cannot be applied directly to the QXRR simulations. The present article proposes and discusses models for simulation of QXRR measurements of curved samples, which are applicable for analysis of liquid materials. © Published under licence by IOP Publishing Ltd.