Abstract
A microwave detection method was applied to study weak localization and antilocalization in epitaxial graphene sheets grown on both polarities of SiC substrates. Both coherence and scattering length values were obtained. The scattering lengths were found to be smaller for graphene grown on C-face of SiC. The decoherence rate was found to depend linearly on temperature, showing the electron-electron scattering mechanism. © 2013 AIP Publishing LLC.
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CITATION STYLE
Drabińska, A., Wołoś, A., Kamińska, M., Strupinski, W., & Baranowski, J. M. (2013). Microwave studies of weak localization and antilocalization in epitaxial graphene. In AIP Conference Proceedings (Vol. 1566, pp. 159–160). American Institute of Physics Inc. https://doi.org/10.1063/1.4848334
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