Abstract
The article presents measurement results of prototype integrated circuits for acquisition and processing of images in real time. In order to verify a new concept of circuit solutions of analogue image processors, experimental integrated circuits were fabricated. The integrated circuits, designed in a standard 0.35 μm CMOS technology, contain the image sensor and analogue processors that perform low-level convolution-based image processing algorithms. The prototype with a resolution of 32 × 32 pixels allows the acquisition and processing of images at high speed, up to 2000 frames/s. Operation of the prototypes was verified in practice using the developed software and a measurement system based on a FPGA platform. © 2012 Polish Academy of Sciences. All rights reserved.
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Jendernalik, W., Jakusz, J., Blakiewicz, G., Szczepański, S., & Piotrowski, R. (2012). Characteristics of an image sensor with early-vision processing fabricated in standard 0.35 μm CMOS technology. Metrology and Measurement Systems, 19(2), 191–202. https://doi.org/10.2478/v10178-012-0017-8
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