Cumulative conforming control chart assuming discrete weibull distribution

Abstract

Time Between Events (TBE) charts have advantages over the traditional control charts when monitoring high quality processes with very low defect rates. This article introduces a new discrete TBE control chart following discrete Weibull distribution. The design of the proposed chart is derived analytically and discussed numerically. Moreover, the performance is assessed by using the Average Run Length (ARL) and the Coefficient of Variation of Run Length (CVRL). Besides simulation studies, the proposed scheme is also illustrated using four real data examples.