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Scanning Tunneling Microscopy(STM). Application for Material Science. Cleaved Surface of Native Semimetals(As, Bi, Te).

  • SUGITA T
Nihon Kessho Gakkaishi (1993) 35(2) 107-110
DOI: 10.5940/jcrsj.35.107
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SUGITA, T. (1993). Scanning Tunneling Microscopy(STM). Application for Material Science. Cleaved Surface of Native Semimetals(As, Bi, Te). Nihon Kessho Gakkaishi, 35(2), 107–110. https://doi.org/10.5940/jcrsj.35.107

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