Systematic evolution of temperature-dependent resistivity in La2-xSrxCuO4

559Citations
Citations of this article
92Readers
Mendeley users who have this article in their library.
Get full text

Abstract

The in-plane resistivity (ab) of La2-xSrxCuO4 has been studied over a wide temperature (41000 K) and composition range (0 <0.1), we observe first indications of resistivity saturation and analyze the resistivity as indicative of a small Fermi surface. In the overdoped range (x>0.2), ab follows a novel power-law dependence, T1.5, over the entire temperature range up to 1000 K. © 1992 The American Physical Society.

Cite

CITATION STYLE

APA

Takagi, H., Batlogg, B., Kao, H. L., Kwo, J., Cava, R. J., Krajewski, J. J., & Peck, W. F. (1992). Systematic evolution of temperature-dependent resistivity in La2-xSrxCuO4. Physical Review Letters, 69(20), 2975–2978. https://doi.org/10.1103/PhysRevLett.69.2975

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free