ARPES Signatures of Few-Layer Twistronic Graphenes

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Abstract

Diverse emergent correlated electron phenomena have been observed in twisted-graphene layers. Many electronic structure predictions have been reported exploring this new field, but with few momentum-resolved electronic structure measurements to test them. We use angle-resolved photoemission spectroscopy to study the twist-dependent (1° < θ < 8°) band structure of twisted-bilayer, monolayer-on-bilayer, and double-bilayer graphene (tDBG). Direct comparison is made between experiment and theory, using a hybrid k·p model for interlayer coupling. Quantitative agreement is found across twist angles, stacking geometries, and back-gate voltages, validating the models and revealing field-induced gaps in twisted graphenes. However, for tDBG at θ = 1.5 ± 0.2°, close to the magic angle θ = 1.3°, a flat band is found near the Fermi level with measured bandwidth Ew = 31 ± 5 meV. An analysis of the gap between the flat band and the next valence band shows deviations between experiment (Δh = 46 ± 5 meV) and theory (Δh = 5 meV), indicative of lattice relaxation in this regime.

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Nunn, J. E., McEllistrim, A., Weston, A., Garcia-Ruiz, A., Watson, M. D., Mucha-Kruczynski, M., … Wilson, N. R. (2023). ARPES Signatures of Few-Layer Twistronic Graphenes. Nano Letters, 23(11), 5201–5208. https://doi.org/10.1021/acs.nanolett.3c01173

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