Abstract
Control of the surface and interface chemistry of colloidal quantum dots (CQDs) is critical to achieving a product with good air stability and high performing optoelectronic devices. Through various surface passivation treatments, vast improvements have been made in fields such as CQD photovoltaics; however devices have not currently reached commercial standards. We show how X-ray photoelectron spectroscopy (XPS) can provide a better understanding of exactly how surface treatments act on CQD surfaces, and the effect of surface composition on air stability and device performance. We illustrate this with PbS-based CQDs, using XPS to measure oxidation processes, and to quantify the composition of the topmost surface layer after different surface treatments. We also demonstrate the use of synchrotron radiation-excited depth-profiling XPS, a powerful technique for determining the surface composition, chemistry and structure of CQDs. This review describes our recent progress in characterization of CQD surfaces using SR-excited depth profiling XPS and other photoemission techniques.
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Clark, P. C. J., & Flavell, W. R. (2019, July 1). Surface and Interface Chemistry in Colloidal Quantum Dots for Solar Applications Studied by X-Ray Photoelectron Spectroscopy. Chemical Record. John Wiley and Sons Inc. https://doi.org/10.1002/tcr.201800085
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