Abstract
Methyl- and ethyl-terminated Si(111) surfaces prepared by a two-step chlorination/alkylation method were characterized by low temperature scanning tunneling spectroscopy (STS), The STS data showed remarkably low levels of midgap states on the CH 3- and C 2H 5-terminated Si surfaces. A large conductance gap relative to the Si band gap was observed for both surfaces as well as for the hydrogen-terminated Si(111) surface. This large gap is ascribed to scanning tunneling microscope tip-induced band bending resulting from a low density of midgap states which avoid pinning of the Fermi levels on these passivated surfaces. © 2006 American Institute of Physics.
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CITATION STYLE
Yu, H., Webb, L. J., Heath, J. R., & Lewis, N. S. (2006). Scanning tunneling spectroscopy of methyl- and ethyl-terminated Si(111) surfaces. Applied Physics Letters, 88(25). https://doi.org/10.1063/1.2203968
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