Monte-carlo-based estimation of the X-ray energy spectrum for CT artifact reduction

Abstract

Beam hardening and scattering effects can seriously degrade image quality in polychromatic X-ray CT imaging. In recent years, polychromatic image reconstruction techniques and scatter estimation using Monte Carlo simulation have been developed to compensate for beam hardening and scattering CT artifacts, respectively. Both techniques require knowledge of the X-ray tube energy spectrum. In this work, Monte Carlo simulations were used to calculate the X-ray energy spectrum of FleXCT, a novel prototype industrial micro-CT scanner, enabling beam hardening and scatter reduction for CT experiments. Both source and detector were completely modeled by Monte Carlo simulation. In order to validate the energy spectra obtained via Monte Carlo simulation, they were compared with energy spectra obtained via a second method. Here, energy spectra were calculated from empirical measurements using a step wedge sample, in combination with the Maximum Likelihood Expectation Maximization (MLEM) method. Good correlation was achieved between both approaches, confirming the correct modeling of the FleXCT system by Monte Carlo simulation. After validation of the modeled FleXCT system through comparing the X-ray spectra for different tube voltages inside the detector, we calculated the X-ray spectrum of the FleXCT X-ray tube, independent of the flat panel detector response, which is a prerequisite for beam hardening and scattering CT artifacts.