Abstract
In this study participants will learn how the Hitachi TM3000 scanning electron microscope (SEM) played a central role in one school's movement towards Next Generation Science Standards (NGSS) and promoted exceptional student engagement. The device was used to create high quality images that were used by students in a variety of lab activities including a simulated crime scene investigation focusing on developing evidence based arguments as well as a real world conservation biology study. It provided opportunities for small group and independent investigations in support of NGSS, and peer-peer mentoring. Furthermore, use of the device was documented and were included to enhance secondary students'college and scholarship applications, all of which were successful. © 2014 SPIE.
Cite
CITATION STYLE
Menshew, D. E. (2014). Using the Hitachi SEM to engage learners and promote next generation science standards inquiry. In Scanning Microscopies 2014 (Vol. 9236, p. 92360M). SPIE. https://doi.org/10.1117/12.2066385
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