Structural Electrical and Detection Properties of Copper Oxide Based on Optoelectronic Device

Abstract

In this work, the effect of different substrate temperatures on the electrical and detection properties of Cu0z copper oxide thin film has been carried out using Reactive Pulsed Laser Deposition technique (RPLD). λ = 1046 nm Q-switch Nd-YAG laser with (900 mj) laser energy's has been used to ablated pure copper target and deposited on the Silicon substrates. The X-ray diffraction in sour the formation of polycrystalline Cu2O nanostructure thin film.