Polarized Raman scattering and localized embedded strain in self-organized Si/Ge nanostructures

Kamenev, B. V., Grebel, H., Tsybeskov, L., Kamins, T. I., Williams, R. S., Baribeau, J. M., & Lockwood, D. J. (2003). Polarized Raman scattering and localized embedded strain in self-organized Si/Ge nanostructures. Applied Physics Letters, 83(24), 5035–5037. https://doi.org/10.1063/1.1628403