Abstract
The negatively charged tin-vacancy center in diamond (SnV-) is an emerging platform for building the next generation of long-distance quantum networks. This is due to the SnV-'s favorable optical and spin properties including bright emission, insensitivity to electronic noise, and long spin coherence times at temperatures above 1 K. Here, we demonstrate measurement of a single SnV- electronic spin with a single-shot readout fidelity of 87.4%, which can be further improved to 98.5% by conditioning on multiple readouts. In the process, we develop understanding of the relationship between strain, magnetic field, spin readout, and microwave spin control. We show that high-fidelity readout is compatible with rapid microwave spin control, demonstrating a favorable parameter regime for use of the SnV- center as a high-quality spin-photon interface. Finally, we use weak quantum measurement to study measurement-induced dephasing; this illuminates the fundamental interplay between measurement and decoherence in quantum mechanics, and provides a universal method to characterize the efficiency of color-center spin readout. Taken together, these results overcome an important hurdle in the development of the SnV - based quantum technologies and, in the process, develop techniques and understanding broadly applicable to the study of solid-state quantum emitters.
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CITATION STYLE
Rosenthal, E. I., Biswas, S., Scuri, G., Lee, H., Stein, A. J., Kleidermacher, H. C., … Vučković, J. (2024). Single-Shot Readout and Weak Measurement of a Tin-Vacancy Qubit in Diamond. Physical Review X, 14(4). https://doi.org/10.1103/PhysRevX.14.041008
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