Is There an Answer?

Abstract

Back When I first got into the electronic test, over 40 years ago, things were simple. You applied a test to a chip, usually a functional test, and you got a result. The expected value, obtained during simulation, was a series of vectors, ones, and zeroes, which was simple to compare with the circuit output. If your simulation and test program were good, the outputs would match except when the circuit was faulty.