Wide operation margin of toggle mode switching for magnetic random access memory with preceding negative pulse writing scheme

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Abstract

In this work, a writing scheme with preceding negative pulse wave form for toggle magnetic random access memory (MRAM) is proposed to enhance the switching yield and enable a low current switching. The failure mechanism of toggle switching is studied by micromagnetic analysis. As a result of broadened operation window and reduced switching current, the scalability of MRAM is feasible with the robust toggle operation. © 2006 American Institute of Physics.

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Hung, C. C., Lee, Y. J., Kao, M. J., Wang, Y. H., Huang, R. F., Chen, W. C., … Chao, S. (2006). Wide operation margin of toggle mode switching for magnetic random access memory with preceding negative pulse writing scheme. Applied Physics Letters, 88(11). https://doi.org/10.1063/1.2181628

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