Abstract
The optical bright- and dark-field visualization (see image) of single-walled carbon nanotubes spin-casted onto Si/SiO2 substrates with a 300-nm-thick oxide coating is reported. This novel procedure gives access to a low-cost correlation of Raman spectroscopy with microscopic techniques (atomic force microscopy, scanning electron microscopy) greatly facilitating nanotube characterization.
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CITATION STYLE
Backes, C., Englert, J. M., Bernhard, N., Hauke, F., & Hirsch, A. (2010). Optical visualization of carbon nanotubes-a unifying linkage between microscopic and spectroscopic characterization techniques. Small, 6(18), 1968–1973. https://doi.org/10.1002/smll.201001019
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