Transmission electron microscopy

Abstract

Transmission electron microscopy (TEM) is an important tool for characterization of material microstructures. A beam of electrons is transmitted through an ultra-thin specimen, interacting with the specimen as it passes through. An image is then formed from this interaction, and the image either can be magnified and focused onto an imaging device or can be detected by a sensor such as a chargecoupled device (CCD) camera (Williams and Carter, 2007).