A near edge X-ray absorption fine structure (NEXAFS) study of the response mechanism of the iron (III) chalcogenide glass membrane ion-selective electrode

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Abstract

We have utilized synchrotron radiation-X-ray photoelectron spectroscopy (SR-XPS) and near edge X-ray absorption fine structure (NEXAFS) to demonstrate unequivocally that the modified surface layer (MSL) of the iron chalcogenide glass ion-selective electrode (ISE) comprises a mixture of iron(II) and iron(III) redox states, as proposed in previous theories to explain the mixed electron transfer and ion exchange response mechanism of this analytically important ISE. © 2014 Elsevier B.V.

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Maric, M., Sohail, M., & De Marco, R. (2014). A near edge X-ray absorption fine structure (NEXAFS) study of the response mechanism of the iron (III) chalcogenide glass membrane ion-selective electrode. Electrochemistry Communications, 41, 27–30. https://doi.org/10.1016/j.elecom.2014.01.017

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