Abstract
Aerospace devices are vulnerable to heavy ion radiation in space, and the digital-to-analog (D/A) converters are indispensable components for aerospace equipment signal transmitter-receiver units. The research of on-line test technology and test system for aerospace-class high-speed D/A converters can be used for failure analysis and test evaluation.In this paper, a single event effect (SEE) experiment on-line monitoring system is designed, which can easily and effectively monitor the SEL, SEFI, SEU and SET event of D/A converter. The experiment was completed by HIRFL and HI-13. Finally, the result and conclusion are obtained.
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CITATION STYLE
Wei, Y., Li, J., Yu, Z., Chen, C., Liu, J., Wen, X., & Wang, J. (2019). A single-event irradiation failure analysis test system for high speed digital-to-analog converter. In Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA. Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/IPFA47161.2019.8984795
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