Spatially resolved spectral imaging by a THz-FEL

Abstract

Using the unique characteristics of the free-electron-laser (FEL), we successfully performed high-sensitivity spectral imaging of different materials in the terahertz (THz) and far-infrared (FIR) domain. THz imaging at various wavelengths was achieved using in situ spectroscopy by means of this wavelength tunable and monochromatic source. In particular, owing to its large intensity and directionality, we could collect high-sensitivity transmission imaging of extremely low-transparency materials and three-dimensional objects in the 3–6 THz range. By accurately identifying the intrinsic absorption wavelength of organic and inorganic materials, we succeeded in the mapping of spatial distribution of individual components. This simple imaging technique using a focusing optics and a raster scan modality has made it possible to set up and carry out fast spectral imaging experiments on different materials in this radiation facility.