A Workflow for Imaging 2D Materials using 4D STEM-in-SEM

Abstract

The grain structure and orientation of polycrystalline two-dimensional (2D) materials modulates their thermal, mechanical, and electrical properties. Thus, to rationally control the properties of 2D materials, the as-synthesized grain structure of the 2D materials must be routinely and reliably measured. Although different methods can be used to spatially map the grain structure/orientation of 2D materials, electron diffraction methods are generally regarded as the ‘ground truth’ because they can resolve these characteristics on the nanometer length scale.