Abstract
The Na 0.5Bi 0.5TiO 3 (NBT) thin films sandwiched between Au electrodes and fluorine-doped tin oxide (FTO) conducting glass were deposited using a sol-gel method. Based on electrochemical workstation measurements, reproducible resistance switching characteristics and negative differential resistances were obtained at room temperature. A local impedance spectroscopy measurement of Au/NBT was performed to reveal the interface-related electrical characteristics. The DC-bias-dependent impedance spectra suggested the occurrence of charge and mass transfer at the interface of the Au/NBT/FTO device. It was proposed that the first and the second ionization of oxygen vacancies are responsible for the conduction in the low- and high-resistance states, respectively. The experimental results showed high potential for nonvolatile memory applications in NBT thin films. © to the authors 2009.
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Zhang, T., Zhang, X., Ding, L., & Zhang, W. (2009). Study on resistance switching properties of Na 0.5Bi 0.5TiO 3 thin films using impedance spectroscopy. Nanoscale Research Letters, 4(11), 1309–1314. https://doi.org/10.1007/s11671-009-9397-4
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