In situ electronic structure investigation ofMn doped BiFeO3 thin films

Abstract

The electronic structure of BiFe1-xMnxO3 (0≤x≤0.3) thin films has been investigated by in situ near edge X-ray absorption fine structure (NEXAFS) and photoemission spectroscopy.Fe ions are found to be trivalent for the whole range of x in BiFe1-xMnxO 3 and a hybridization between the Fe 3d and O 2p states is decreased by increasing Mn concentration. Charge transfer multiplet (CTM) calculation is used to understand the experimental results of the Fe L-edge spectra. The experimental results plus the CTM calculation showsthe hybridization degree between the transition metal 3d and O 2p states areplay important role for the multiferroic properties of underlying systems.