Abstract
Raman scattering was used to characterize BaTiO3/YBa2Cu3O7-x thin film bilayer structure grown by pulsed laser ablation (PLA). The Raman spectra were compared with the x-ray diffraction (XRD) spectra. The Raman peaks due to the tetragonal phase of BaTiO3 (BTO) and to the 123 phase YBa2Cu3O7-x (YBCO) were observed at room temperature. XRD results showed that the BaTiO3 thin film has highly c-axis oriented tetragonal phase and is fully epitaxial. However, some impurity phases were observed from the Raman spectrum of the BaTiO3 thin film. © 1996 American Institute of Physics.
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CITATION STYLE
Cui, D., Li, C., Ma, K., Zhou, Y., Liu, Y., Chen, Z., … Li, L. (1996). Raman spectroscopy of laser ablated BaTiO3/YBa2Cu3O7-x thin film bilayer structure. Applied Physics Letters, 68(6), 750–752. https://doi.org/10.1063/1.116730
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