Abstract
Positron annihilation was applied to measuring critical pore sizes in various materials. In recent years, positron annihilation with a variable-energy positron beam has emerged as a powerful tool for the investigation of porous thin films synthesized as low-k dielectrics, high performance gas sensor materials, and so on. This paper is a brief overview of recent progress in nanopore characterization of thin films by means of positron annihilation with a description of several important issues relevant to positron annihilation.
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CITATION STYLE
Ito, K., & Kobayashi, Y. (2005). Variable-energy positron annihilation as highly sensitive nanoporosimetry for porous thin films. In Acta Physica Polonica A (Vol. 107, pp. 717–723). Polish Academy of Sciences. https://doi.org/10.12693/APhysPolA.107.717
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