Optical properties of BiCrxFe1-xO3 films grown by sol-gel method

Abstract

The BiCrxFe1-xO3 thin films were fabricated on Si substrate by sol-gel method with x range from 0 to 0.05. X-ray diffraction analysis shows that both pure BiFeO3 thin film and Cr-doped BiFeO3 thin films have rhombohedral structure with space group R3c. Moreover, the influence of different values of x on the extinction coefficient and refractive index were investigated in order to exploit their possible application in optoelectronic devices. The optical constants of the Cr-doped BiFeO3 thin films in the wavelength range 500-1100 nm were obtained by spectroscopic ellipsometry, and the band-gap energy of BiCr 0.03Fe0.97O3 was found to be 2.40 ±0.02 eV, and that of BiCr0.05Fe0.95O3 was 2.30 ±0.02 eV.