Low temperature deformation behavior of an electromagnetically bulged 5052 aluminum alloy

Abstract

The fundamental understanding of the deformation behavior of electromagnetically formed metallic components under extreme conditions is important. Here, the effect of low temperature on the deformation behavior of an electromagnetically-bulged 5052 aluminum alloy was investigated through uniaxial tension. We found that the Portevin-Le Chatelier Effect, designated by the serrated characteristic in stress-strain curves, continuously decays until completely disappears with decreasing temperature. The physical origin of the phenomenon is rationalized on the basis of the theoretical analysis and the Monte Carlo simulation, which reveal an increasing resistance to dislocation motion imposed by lowering temperature. The dislocations are captured completely by solute atoms at 50 °C, which results in the extinction of Portevin-Le Chatelier. The detailed mechanism responsible for this process is further examined through Monte Carlo simulation.