Abstract
We report on angle-resolved time domain spectroscopy (TDS) carried out on a prismlike negative index metamaterial operating around 0.5 THz. The wedge-type devices are constituted of hole arrays etched in gold thin films, which are stacked according to a sequential mask shift. By means of a goniometric TDS setup and subsequent analysis of the temporal waveforms, negative refraction is demonstrated with values close to n=-1 around 0.5 THz. The dispersion of refractive index retrieved from the Snell-Descartes law shows comparable trends in comparison with the dispersion deduced from complex transmission and reflection measurements on slab-type samples. © 2010 American Institute of Physics.
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CITATION STYLE
Wang, S., Garet, F., Blary, K., Lheurette, E., Coutaz, J. L., & Lippens, D. (2010). Experimental verification of negative refraction for a wedge-type negative index metamaterial operating at terahertz. Applied Physics Letters, 97(18). https://doi.org/10.1063/1.3511540
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