Abstract
In this paper we present a method to compute the time-dependent availability of repairable m-out-of-n redundant and cold standby systems by arbitrary distributed time to unit failure and time to unit repair and arbitrary number of repair facilities. The method allows us to consider systems with a large number of units. It is accurate in results and efficient in computations. © 1995.
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CITATION STYLE
Gurov, S. V., & Utkin, L. V. (1995). The time-dependent availability of repairable m-out-of-n and cold standby systems by arbitrary distributions and repair facilities. Microelectronics Reliability, 35(11), 1377–1393. https://doi.org/10.1016/0026-2714(95)00051-3
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