X-ray imaging and diffraction from surface phonons on GaAs

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Abstract

Interdigital transducers were utilized to stimulate surface acoustic wave (SAW) on GaAs (001) surface. The effort resulted in the generation of surface phonons characterized by wavelengths of as low as 3.5 μm. Through high-resolution X-ray diffraction, 12 phonon-induced satellite reflections were also found beside the GaAs (004) reflection. These satellite reflections were noted to have a width of 9 arcsec.

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Sauer, W., Streibl, M., Metzger, T. H., Haubrich, A. G. C., Manus, S., Wixforth, A., … Baruchel, J. (1999). X-ray imaging and diffraction from surface phonons on GaAs. Applied Physics Letters, 75(12), 1709–1711. https://doi.org/10.1063/1.124797

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