Measurement and modeling of pulsed microchannel plate operation

Abstract

Microchannel plates (MCPs) are a standard detector for fast-framing x-ray imaging and spectroscopy of high-temperature plasmas. The MCP is coated with conductive striplines that carry short duration voltage pulses to control the timing and amplitude of the signal gain. This gain depends on the voltage to a large exponent so that small reflections or impedance losses along the striplines can have a significant impact on the position-dependent amplitude and pulse width of the gain. Understanding the pulsed gain response therefore requires careful measurements of the position- and time-dependent surface voltage coupled with detailed modeling of the resulting electron cascade. We present measurements and modeling of the time- and space-dependent gain response of MCP detectors designed for use at Sandia National Laboratories' Z facility. The pulsed gain response is understood through measurements using a high impedence probe to determine the voltage pulse propagating along the stripline surface. Coupling the surface voltage measurements with Monte Carlo calculations of the electron cascade in the MCP provides a prediction of the time- and position-dependent gain that agrees with measurements made on a subpicosecond UV laser source to within the 25% uncertainty in the simulations. © 2008 American Institute of Physics.