Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick-Baez microscope

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Abstract

A simultaneous high-resolution x-ray backlighting and self-emission imaging method for laser-produced plasma diagnostics is developed in which two Kirkpatrick-Baez imaging channels for high-energy and low-energy diagnostics are constructed using a combination of multilayer mirrors in near-coaxial form. By using a streak or framing camera placed on the image plane, both backlit and self-emission images of a laser-produced plasma with high spatial and temporal resolution can be obtained simultaneously in a single shot. This paper describes the details of the method with regard to its optical and multilayer design, assembly, and alignment method. In addition, x-ray imaging results with a spatial resolution better than 5 μm in the laboratory and experimental results with imploding capsules in the SG-III prototype laser facility are presented.

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Yi, S. Z., Dong, J. Q., Jiang, L., Huang, Q. S., Guo, E. F., & Wang, Z. S. (2022). Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick-Baez microscope. Matter and Radiation at Extremes, 7(1). https://doi.org/10.1063/5.0062758

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