Journal Article

Examining nanoparticle assemblies using high spatial resolution x-ray microtomography

Journal of Applied Physics (2004) 96(5) 2889-2894
DOI: 10.1063/1.1776635
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Jenneson, P. M., Luggar, R. D., Morton, E. J., Gundogdu, O., & Tüzün, U. (2004). Examining nanoparticle assemblies using high spatial resolution x-ray microtomography. Journal of Applied Physics, 96(5), 2889–2894. https://doi.org/10.1063/1.1776635

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